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    • Properties of Firback-Elais 175-μm sources in the Elais N2 region 

      Taylor, E. L.; Robert Mann, Robert; Efstathiou, Andreas; Babbedge, Tom S.R.; Rowan-Robinson, Michael; Lagache, Guilaine; Andy R. Lawrence, Andy; Mei, Simona; Vaccari, Mattia; Héraudeau, Ph; Oliver, Sebastian James; Dennefeld, Michel; Pérez-Fournón, Ismaël; Serjeant, Stephen B.G.; González-Solares, Eduardo A.; Puget, Jean Loup; Dole, Hervé A.; Lari, Carlo (2005-08-21)
      We report on a search for the optical counterparts of 175-μm selected sources from the Far-Infrared Background (FIRBACK) survey in the European Large Area 750 Survey (ELAIS) N2 field. Applying a likelihood ratio technique ...